Micro-structure changes caused by thermal evolution in GexAsySe1−x−ythin films by in situ measurements, Materials
发布时间：2024-09-26
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- 关键字：
- X.Q. Su#, Y. Pan#, L. Wang*,D. Gao, Micro-structure changes caused by thermal evolution in GexAsySe1−x−ythin films by in situ measurements, Materials, 2021, 14, 2572. (SCI 三区 IF: 3.623)
- 是否译文：
- 否
- 发表时间：
- 2021-01-01
- 收录刊物：
- SCI