一种基于准光腔的半导体材料少数载流子寿命检测方法
Release time:2024-08-09
Hits:
- Affilication of Author(s):
- 信息与控制工程学院
- Scope of patent:
- 国内
- Type of Patent:
- 发明专利
- State of Patent:
- 专利申请
- Service Invention or Not:
- yes
- Application Date:
- 2022-09-29
- First Author:
- 杨放,yeming
- Next One:一种用于无源互调成像检测的可调谐同轴谐振探头